Corporate News:

February 8, 2008: Field Metrica Inc. agrees to continue a research contract in colarboration with the University of Toronto, the University of Chicago and the United States Department of Defence.

December 1, 2007: Field Metrica Inc. signs a research agreement with the University of Toronto to continue research on new concepts in electrical quantity imaging, led by Professor Mike Joy.

December 1, 2006: Field Metrica Inc. signs a research agreement with the University of Toronto to continue researching new concepts in electrical quantity imaging. The research is being supervised by Professor Mike Joy of the University of Toronto.

November 1, 2004: Field Metrica Inc. signs a research agreement with the University of Toronto and MITACS to explore new concepts in electrical quantity imaging. The research is being supervised by Professors Adrian Nachman and Mike Joy of the University of Toronto.

July 15, 2004: Field Metrica Inc. signs a technology license agreement with the University of Toronto Innovations Foundation for an exclusive license to "Current Density Impedance Imaging" technology.

January 26, 2004: Field Metrica Inc. is established as a spinoff business to the Current Density Imaging Research Group at the University of Toronto.